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a611634de819bac9e0ad475d245392c8cbb1e0b3
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tests
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device
c08b6a7
tests: Fix tests code and comments style
by Jakub Czapiga
· 2 years, 7 months ago
7c6081e
tests: Improve test output readability
by Jakub Czapiga
· 3 years ago
ce55ca2
tests: Rework mocking facility
by Patrick Georgi
· 3 years, 2 months ago
a01ee36
device/dram: Add method for converting MHz to MT/s
by Rob Barnes
· 4 years ago
1e14de8
tests: Add some basic warnings and fix resulting issues
by Julius Werner
· 4 years, 2 months ago
2174481
tests: Add <tests/test.h> wrapper header and fix --gc-sections
by Julius Werner
· 4 years, 3 months ago
6b5bc77
treewide: Remove "this file is part of" lines
by Patrick Georgi
· 4 years, 3 months ago
b0800d3
tests: Add proper license headers
by Jan Dabros
· 4 years, 3 months ago
a67cc5f
tests: Add device/i2c-test test case
by Jan Dabros
· 4 years, 4 months ago