blob: c89ef76103d3ee08cdb85542bd2ad0046eefe976 [file] [log] [blame]
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#include "bdk.h"
#include <libbdk-hal/bdk-utils.h>
/* Used for all memory reads/writes related to the test */
#define READ64(address) __bdk_dram_read64(address)
#define WRITE64(address, data) __bdk_dram_write64(address, data)
/**
* Fast scan test. This test is meant to find gross errors caused by read/write
* level failing on a single rank or dimm. The idea is to scan through all of
* memory in large steps. The large steps hit each rank multiple times, but not
* every byte. If the whole rank has errors, his should find it quickly. This test
* is suitable for an alive test during early boot.
*
* @param area Starting physical address
* @param max_address
* Ending physical address, exclusive
* @param bursts Burst to run
*
* @return Number of errors
*/
int __bdk_dram_test_fast_scan(uint64_t area, uint64_t max_address, int bursts)
{
int failures = 0;
const uint64_t step = 0x10008; /* The 8 is so we walk through cache lines too */
const uint64_t pattern1 = 0xaaaaaaaaaaaaaaaa;
const uint64_t pattern2 = 0x5555555555555555;
/* Walk through the region incrementing our offset by STEP */
uint64_t a = area;
while (a + 16 <= max_address)
{
WRITE64(a, pattern1);
WRITE64(a+8, pattern2);
__bdk_dram_flush_to_mem_range(a, a + 16);
a += step;
}
/* Read back, checking the writes */
a = area;
while (a + 16 <= max_address)
{
/* Prefetch 3 ahead for better performance */
uint64_t pre = a + step * 2;
if (pre + 16 < max_address)
BDK_PREFETCH(pre, 0);
/* Check pattern 1 */
uint64_t data1 = READ64(a);
if (bdk_unlikely(data1 != pattern1))
{
failures++;
__bdk_dram_report_error(a, data1, pattern1, 0, -1);
}
/* Check pattern 2 */
uint64_t data2 = READ64(a+8);
if (bdk_unlikely(data2 != pattern2))
{
failures++;
__bdk_dram_report_error(a+8, data2, pattern2, 0, -1);
}
a += step;
}
return failures;
}